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F-38 Combination of Scanning Probe Microscope and X-ray Analysis—Invited
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- Journal:
- Powder Diffraction / Volume 19 / Issue 2 / June 2004
- Published online by Cambridge University Press:
- 20 May 2016, p. 202
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A Double Silicon Drift Type Detector System for EDS with Ultrahigh Efficiency and Throughput for TEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1150-1151
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- August 2014
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Micro X-ray flourescence instrument developed in combination with atomic force microscope
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- Journal:
- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 01 March 2012, pp. 137-140
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Evaluation on Electromigration and Stressmigration of Metal Interconnections by Hardness Measurements
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- Journal:
- MRS Online Proceedings Library Archive / Volume 226 / 1991
- Published online by Cambridge University Press:
- 26 February 2011, 425
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- 1991
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Single Crystal Growth of YBa2Cu4O8 and Y2Ba4Cu7O15 Under High Oxygen Pressure
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- MRS Online Proceedings Library Archive / Volume 251 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 319
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- 1991
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Evaluation on Electromigration and Stressmigration of Metal Interconnections by Hardness Measurements
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- Journal:
- MRS Online Proceedings Library Archive / Volume 225 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 167
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- 1991
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Preparation and Transition Temperature of Ca‐Substituted Yba2Cu4O8
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- Journal:
- MRS Online Proceedings Library Archive / Volume 169 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 241
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- 1989
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