17 results
Improvement of Principal Component Analysis for Quantification of Spectrum-Imaging Datasets
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 576-577
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- August 2018
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Evaluation of Sensitivity of Multivariate Statistical Analysis on STEM Spectrum-Imaging Datasets and its Improvement
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 112-113
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- August 2014
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Spatially-Resolved Diffractometry with Atomic-Column Resolution
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 328-329
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- July 2012
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Crystal Structure Analysis Using Annular Dark-Field Imaging with High Precision
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 468-469
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- July 2009
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Fourier Analysis of Ronchigram and Aberration Assessment
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1094-1095
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- July 2009
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Geometric focusing of intense pulsed ion beams from racetrack type magnetically insulated diodes
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- Laser and Particle Beams / Volume 3 / Issue 2 / May 1985
- Published online by Cambridge University Press:
- 09 March 2009, pp. 119-155
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Optimal Noise Filters in High-Resolution Electron Microscopy
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 902-903
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- August 2007
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Atomic Column Imaging Using STEM-EELS
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1232-1233
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- August 2007
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Validity of IWFR to Reconstruct an Exit Surface Wave
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1460-1461
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- August 2006
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Improvement of TEM-EELS and Its Application for Materials in Semiconductor Devices
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 106-107
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- August 2006
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Deconvolution Processing in Analytical STEM: Monochromator for EELS and Cs-Corrector for STEM-HAADF
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1430-1431
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- August 2005
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Transport of Intensity Equation Applied to Study Quasi-Dynamic Surface and Boundary Reconstruction
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2160-2161
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- August 2005
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Band alignment at CdS/wide-band-gap Cu(In,Ga)Se2 hetero-junction by using PES/IPES
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- MRS Online Proceedings Library Archive / Volume 865 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, F5.16
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- 2005
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Wide-gap CIGS solar cells with Zn1-yMgyO transparent conducting film
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- MRS Online Proceedings Library Archive / Volume 865 / 2005
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- 01 February 2011, F14.6
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- 2005
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Characterization and Oxidation Kinetics of Reactively Sputtered Ti1−xAlxN Film
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- MRS Online Proceedings Library Archive / Volume 541 / 1998
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- 10 February 2011, 191
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- 1998
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Progress in Computer Assisted Electron Microscopy
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 1093-1094
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- August 1997
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Digital Process for advanced VLSI's and Surface Reaction Study
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- MRS Online Proceedings Library Archive / Volume 222 / 1991
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- 16 February 2011, 195
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- 1991
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