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PVD Growth of FCC Metal Films On Single Crystal Si And Ge Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 562 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 93
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- 1999
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Tem Characterization of Grain Boundaries in Mazed Bicrystal Films of Aluminum
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- Journal:
- MRS Online Proceedings Library Archive / Volume 229 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 167
- Print publication:
- 1991
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Shape Transformations of Ge Precipitates in Al
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- Journal:
- MRS Online Proceedings Library Archive / Volume 238 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 207
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- 1991
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An HREM Investigation into the Atomic Structure of an Aluminum Grain Boundary
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- Journal:
- MRS Online Proceedings Library Archive / Volume 183 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 45
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- 1990
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The Berkeley Atomic Resolution Microscope – an Update
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- Journal:
- MRS Online Proceedings Library Archive / Volume 139 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 277
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- 1989
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