Hostname: page-component-84b7d79bbc-4hvwz Total loading time: 0 Render date: 2024-07-30T09:29:40.209Z Has data issue: false hasContentIssue false

An HREM Investigation into the Atomic Structure of an Aluminum Grain Boundary

Published online by Cambridge University Press:  21 February 2011

C. J. D. Hetherington
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720.
U. Dahmen
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720.
M. A. O'Keefe
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720.
R. Kilaas
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720.
J. Turner
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720.
K. H. Westmacott
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720.
M. J. Mills
Affiliation:
Sandia National Laboratories, Materials Science Department, Livermore, CA 94551-0969.
V. Vitek
Affiliation:
Univ. of Pennsylvania, Dept. of Materials Science and Engineering, Philadelphia, PA 19104.
Get access

Abstract

An experimental high resolution image of a grain boundary has been compared with images simulated from atomic structures calculated by two theoretical methods. Some of the techniques used in the analysis of the images are presented. A good agreement is found between each theory and the experiment, confirming the validity of calculations of such a boundary.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Dahmen, U. and Westmacott, K.H., submitted to J. Electron Micros. Technique (1989).Google Scholar
2. Takaagi, T., Yamada, I. and Sasaki, A., J. Vac. Sci. Technol. A 2, 382 (1984).Google Scholar
3. Dahmen, U. and Westmacott, K.H., Scripta Met. 22, 1673 (1988).Google Scholar
4. Dagens, L., Rasolt, M. and Taylor, R., Phys. Rev. B 11, 2726 (1975).Google Scholar
5. Daw, M.S. and Baskes, M.I., Phys. Rev. B 29, 6443 (1984)Google Scholar
6. O'Keefe, M.A., Dahmen, U. and Hetherington, C.J.D., Mat. Res. Soc. Proc. 159 (1989).10.1557/PROC-159-453Google Scholar
7. Mills, M.J., unpublished.Google Scholar
8. Bourret, A., Rouviere, J.L. and Penisson, J.M., Acta Cryst. A 44, 838847 (1988).Google Scholar