2 results
Buried Oxide Precipitates In A Si Wafer Due to He ION Implantation and High-Temperature Oxidation
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 647 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, O6.3
- Print publication:
- 2000
-
- Article
- Export citation
Electronic Properties and Their Relations to Optical Properties in Rare Earth Doped III-V Semiconductors
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 301 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 139
- Print publication:
- 1993
-
- Article
- Export citation