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Direct Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1226-1227
- Print publication:
- August 2013
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Effects of thermal annealing on the microstructural properties of the lower region in ZnO thin films grown on n-Si (001) substrates
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- Journal:
- Journal of Materials Research / Volume 23 / Issue 4 / April 2008
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1082-1086
- Print publication:
- April 2008
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