7 results
Thickness-dependent Crystallization Behavior of Phase Change Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1072 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1072-G05-02
- Print publication:
- 2008
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Analysis Of Sige Fet Device Structures On Silicon-on-sapphire Substrates by X-Ray Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 533 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 55
- Print publication:
- 1998
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Dependence of Crystallographic Texture of C54 Tisi2 on Thickness and Linewidth In Submicron Cmos Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 427 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 53
- Print publication:
- 1996
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Light Scattering Measurement Of Surface Topography During Formation Of Titanium Silicide.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 406 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 163
- Print publication:
- 1995
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In Situ Analysis of the Formation of thin TISI2, (>50 nm) Contacts in Submicron Cmos Structures during Rapid Thermal Annealing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 402 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 257
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- 1995
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High Resolution X-ray Diffraction Measurements of Strain Relaxed SiGe/Si Structures
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- Journal:
- Advances in X-ray Analysis / Volume 38 / 1994
- Published online by Cambridge University Press:
- 06 March 2019, pp. 181-193
- Print publication:
- 1994
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High-Resolution X-Ray Diffraction Measurements of SiGe/Si Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 375 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 201
- Print publication:
- 1994
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