5 results
D-77 Towards Fast Reciprocal Space Mapping
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- Journal:
- Powder Diffraction / Volume 19 / Issue 2 / June 2004
- Published online by Cambridge University Press:
- 20 May 2016, p. 204
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D092 Structural Characterization of SiGe and SiGe:C Heterostructures Using a Combination of X-ray Methods
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 173
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D-20 Invited—Probing Thin-Layered and Nano-Structured Materials—X-ray Scattering Tools
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 175
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Structural characterization of SiGe and SiGe:C heterostructures using a combination of X-ray scattering methods
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- Journal:
- Powder Diffraction / Volume 19 / Issue 1 / March 2004
- Published online by Cambridge University Press:
- 06 March 2012, pp. 49-52
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Towards fast reciprocal space mapping
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- Journal:
- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 01 March 2012, pp. 125-127
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