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Characterization of Structural Quality of Bonded Silicon-On-Insulator Wafers by Spectroscopic Ellipsometry and Raman Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 809 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, B8.19
- Print publication:
- 2004
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Transmission Electron Microscopy and Electron Holography of Nanophase TiO2 Generated in a Flame Burner System
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- Journal:
- MRS Online Proceedings Library Archive / Volume 457 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 93
- Print publication:
- 1996
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- Article
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