7 results
In-Situ Spectroscopy of Ion-Induced Photon Emission During Metal Nanoparticle Formation in Silica Glass with High-Flux Cu Implantation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 569 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 191
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- 1999
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Flux Dependent Generation Rates of Radiation-Induced Defect Clustering in n-Si Under 17 MeV Proton Irradiation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 540 / 1998
- Published online by Cambridge University Press:
- 15 February 2011, 115
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- 1998
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Applicability of Shallow-Impurity Doped Silicon to Proton Flux Sensors Using Stable Particle-Induced Conductivity
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- Journal:
- MRS Online Proceedings Library Archive / Volume 487 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 423
- Print publication:
- 1997
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In-Situ DLTs Measurement of Metastable Coupling between Proton-Induced Defects and Impurities in n-Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 504 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 15
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- 1997
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Particle - Induced and Photo - Conductivities in Amorphous Si:H Under Proton Irradiation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 439 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 679
- Print publication:
- 1996
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High Current Implantation of Negative Copper Ions into Silica Glasses
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- Journal:
- MRS Online Proceedings Library Archive / Volume 438 / 1996
- Published online by Cambridge University Press:
- 03 September 2012, 435
- Print publication:
- 1996
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Evaluation Of Proton-Induced Deep Levels In n-Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 442 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 287
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- 1996
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