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Composition Fluctuation of In and Well-Width Fluctuation in InGaN/GaN Multiple Quantum Wells in Light-Emitting Diode Devices
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S5 / August 2013
- Published online by Cambridge University Press:
- 06 August 2013, pp. 99-104
- Print publication:
- August 2013
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Atom Probe Tomography of Compound Semiconductors for Photovoltaic and Light-Emitting Device Applications
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- Journal:
- Microscopy Today / Volume 20 / Issue 3 / May 2012
- Published online by Cambridge University Press:
- 03 May 2012, pp. 18-24
- Print publication:
- May 2012
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- Article
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