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XEDS with SDD-Technology in Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 202-203
- Print publication:
- July 2009
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Structural Characterization of InAs/(GaIn)Sb Superlattices for IR Optoelectronics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 421 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 39
- Print publication:
- 1996
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Optical Response of Electron-Hole Plasma in Surface Excited Semiconductors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 23 / 1983
- Published online by Cambridge University Press:
- 22 February 2011, 209
- Print publication:
- 1983
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