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Structural Characterization of InAs/(GaIn)Sb Superlattices for IR Optoelectronics
Published online by Cambridge University Press: 10 February 2011
Abstract
We report on the structural characterization of InAs/(GaIn)Sb superlattices (SL) grown by solid-source molecular-beam epitaxy. SL periodicity and overall structural quality were assessed by high-resolution X-ray diffraction and Raman spectroscopy. Spectroscopic ellipsometry was found to be sensitive to the (GaIn)Sb alloy composition.
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- Copyright © Materials Research Society 1996
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