10 results
D-113 Phase Transformation Textures in Ti-6AI-4V alloy
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- Journal:
- Powder Diffraction / Volume 19 / Issue 2 / June 2004
- Published online by Cambridge University Press:
- 20 May 2016, p. 204
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Spatially Resolved Characterization of Phases in LiFePO4 Battery Cathodes Using Low Loss Electron Energy-loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 432-433
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- August 2014
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Contributors
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- Cerebral Small Vessel Disease
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- 05 June 2014
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- 01 May 2014, pp ix-xii
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The Creep Deformation Mechanisms of Nickel Base Superalloy René 104
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1874-1875
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- August 2005
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Imaging and Characterization of the Microstructure and Creep Deformation Mechanisms of Commercial Nickel-based Superalloys
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1800-1801
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- August 2005
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3D Materials Characterization using Dual-Beam FIB/SEM Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1128-1129
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- August 2004
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Application of FIB-Tomography to the Study of Microstructures in Titanium Alloys
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1178-1179
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- August 2004
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Creep Mechanisms in Equiaxed and Lamellar Ti-48Al
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- Journal:
- MRS Online Proceedings Library Archive / Volume 646 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, N1.6.1
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- 2000
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Dislocation Structure and Deformation Behavior of Intermetallic Compounds
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- MRS Online Proceedings Library Archive / Volume 578 / 1999
- Published online by Cambridge University Press:
- 15 February 2011, 169
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- 1999
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In Situ Analysis of the Formation of thin TISI2, (>50 nm) Contacts in Submicron Cmos Structures during Rapid Thermal Annealing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 402 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 257
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- 1995
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