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Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 702-703
- Print publication:
- August 2013
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Optimization of FIB-Milling Technique for Preparation of TEM Specimens from Copper/Low-K Materials
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 902-903
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- August 1999
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Electrical and Physical Characterization of Ultrathin Silicon Oxynitride Gate Dielectric Films Formed by the Jet Vapor Deposition Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 592 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 307
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- 1999
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Cross-Section Tem Sample Preparation for Copper / Low-K Composite Stacks by Ion Milling
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 862-863
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- July 1998
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An Improved Tool for Wedge-Polishing of Materials for Tem
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- Journal:
- MRS Online Proceedings Library Archive / Volume 480 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 181
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- 1997
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Evaluation of a New Strategy for Transverse Tem Specimen Preparation by Focused-Ion-Beam Thinning
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- Journal:
- MRS Online Proceedings Library Archive / Volume 480 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 173
- Print publication:
- 1997
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Minimization of Non-Uniform Ion-Thinning Effects in Thin Film Transverse Specimens for Transmission Electron Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 254 / 1991
- Published online by Cambridge University Press:
- 21 February 2011, 153
- Print publication:
- 1991
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A Streamlined Technique for Preparation of Transverse Specimens for Transmission Electron Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 199 / 1990
- Published online by Cambridge University Press:
- 16 February 2011, 177
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- 1990
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