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D023 Residual stresses in thin films characterized by the combination of SIN2Ψ and curvate methods: possibilities and limitations
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- Journal:
- Powder Diffraction / Volume 21 / Issue 2 / June 2006
- Published online by Cambridge University Press:
- 20 May 2016, p. 184
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Thermally-induced stresses in thin aluminum layers grown on silicon
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- Powder Diffraction / Volume 19 / Issue 1 / March 2004
- Published online by Cambridge University Press:
- 06 March 2012, pp. 74-76
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Evaluation of experimental stress–strain dependence in thermally cycled Al thin film on Si(100)
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- Powder Diffraction / Volume 19 / Issue 4 / December 2004
- Published online by Cambridge University Press:
- 05 March 2012, pp. 367-371
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Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
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- Journal:
- Powder Diffraction / Volume 21 / Issue 1 / March 2006
- Published online by Cambridge University Press:
- 01 March 2012, pp. 25-29
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