4 results
Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping Layers
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 418-419
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- August 2008
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Combination of TEM and STEM to Investigate the Self-Assembly of Epitaxial Nanocomposites
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 62-63
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- August 2007
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Impact of Sample Thickness on Atomic Resolution Tomography by HAADF-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1564-1565
- Print publication:
- August 2006
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Imaging of Hafnium Atoms and Clusters in Silicon Dioxide
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 46-47
- Print publication:
- August 2006
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