5 results
Investigation of N-Polar AlGaN/GaN and InAlN/GaN Thin Films Grown by MBE
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1570-1571
- Print publication:
- July 2016
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Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS): The Last Step in the Microanalysis of Particulate Matter Isolates
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 520-521
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- July 1998
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Determination of the dependence of the surface force induced contact radius on particle radius: Cross-linked polystyrene spheres on SiO2/silicon
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- Journal:
- Journal of Materials Research / Volume 8 / Issue 3 / March 1993
- Published online by Cambridge University Press:
- 31 January 2011, pp. 662-667
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- March 1993
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High temperature ultrasonic characterization of intrinsic and microstructural changes in ceramic YBa2Cu3O7−δ
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- Journal:
- Journal of Materials Research / Volume 7 / Issue 7 / July 1992
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1629-1635
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- July 1992
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Silicon Consumption During Self-Aligned Titanium Suicide Formation on Shallow Junctions
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- Journal:
- MRS Online Proceedings Library Archive / Volume 160 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 299
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- 1989
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