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Monochromated Low-Voltage Aberration-Corrected TEM for Imaging the Soft/Hard Materials Interface
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1616-1617
- Print publication:
- July 2012
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- Article
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