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Monochromated Low-Voltage Aberration-Corrected TEM for Imaging the Soft/Hard Materials Interface

Published online by Cambridge University Press:  23 November 2012

D.C. Bell ,
D.S. Kohane  and
B.P. Timko
D.C. Bell
Affiliation:
School of Engineering, Harvard University, Cambridge, MA
D.S. Kohane
Affiliation:
Harvard Medical School, Cambridge, MA
B.P. Timko
Affiliation:
Massachusetts Institute of Technology, Cambridge, MA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1616 - 1617
Copyright
Copyright © Microscopy Society of America 2012

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