13 results
On the ergodicity of a class of level-dependent quasi-birth-and-death processes
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- Journal:
- Advances in Applied Probability / Volume 51 / Issue 4 / December 2019
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- 15 November 2019, pp. 1109-1128
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- December 2019
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Low-Loss Imaging of Defect Structures in Two Dimensional Materials Using Aberration Corrected Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 1410-1411
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- July 2016
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Single Atom Imaging and Spectroscopy of Impurities in 2D Materials
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 862-863
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- July 2016
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Inelastic STEM Imaging Based on Low-Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 90-91
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- August 2014
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Simulation of Probe Position-Dependent Electron Energy-Loss Fine Structure
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- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
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- 31 March 2014, pp. 784-797
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- June 2014
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Differences in Structural and Electronic Properties of Conducting LGO/STO and LAO/STO Interfaces
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 1402-1403
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- July 2011
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Modeling Atomic-Resolution Scanning Transmission Electron Microscopy Images
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- Microscopy and Microanalysis / Volume 14 / Issue 1 / February 2008
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- 21 December 2007, pp. 48-59
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- February 2008
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Nanostructure Functionality through Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 1416-1417
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- August 2005
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Interpretation of High Resolution Scanning Transmission Electron Microscope Images Based on Core Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 1420-1421
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- August 2005
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Letter to the Editor: Limitations to the Measurement of Oxygen Concentrations by HRTEM Imposed by Surface Roughness
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- Microscopy and Microanalysis / Volume 11 / Issue 2 / April 2005
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- 08 March 2005, pp. 111-113
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- April 2005
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Materials Applications of Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
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- 01 August 2004, pp. 12-13
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- August 2004
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Atomic-Resolution EELS in Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 24 July 2003, pp. 852-853
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- August 2003
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Device Quality SiO2 Films by Liquid Phase Deposition (LPD) AT 48°C
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- MRS Online Proceedings Library Archive / Volume 716 / 2002
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- 01 February 2011, B7.9
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- 2002
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