8 results
TEM characterization of GaSb grown on single crystal offcut Silicon (001)
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1476-1477
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- July 2017
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Use of a hybrid silicon pixel (Medipix) detector as a STEM detector
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1595-1596
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- August 2015
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Magnetic Dynamics Studied by Time-Resolved Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 649-650
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- August 2015
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Focused Ion Beam Preparation of All Solid State Nanobattery for TEM In Situ Cycling Studies
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1562-1563
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- July 2011
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Foreword
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- Stone's Plastic Surgery Facts and Figures
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- 07 September 2011
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- 09 June 2011, pp xi-xii
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Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 2 / April 2011
- Published online by Cambridge University Press:
- 04 March 2011, pp. 240-245
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- April 2011
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Three-dimensional study of indentation-induced cracks in an amorphous carbon coating on a steel substrate
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- Journal:
- Journal of Materials Research / Volume 21 / Issue 10 / October 2006
- Published online by Cambridge University Press:
- 03 March 2011, pp. 2600-2605
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- October 2006
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Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1296-1297
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- August 2006
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