13 results
Self-Limiting Growth Kinetics of 3D Coherent Islands
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- Journal:
- MRS Online Proceedings Library Archive / Volume 399 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 271
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- 1995
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Triangular Step Instability and 2D/3D Transition During the Growth of Strained Ge Films on Si(100)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 379 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 33
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- 1995
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Ab Initio Study of Expitaxial Growth on a Si(100) Surface in the Presence of Steps
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- Journal:
- MRS Online Proceedings Library Archive / Volume 408 / 1995
- Published online by Cambridge University Press:
- 10 February 2011, 439
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- 1995
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Incoherent Imaging by Z-Contrast Stem: Towards 1Å Resolution
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- Journal:
- MRS Online Proceedings Library Archive / Volume 332 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 607
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- 1994
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Surface Stress, Morphological Development, and Dislocation Nucleation During Strained-Layer Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 317 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 297
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- 1993
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Evolving Surface Cusps During Strained Layer Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 312 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 47
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- 1993
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Step-Driven Surface Segregation and Ordering During Si-Ge MBE Growth
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- Journal:
- MRS Online Proceedings Library Archive / Volume 263 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 9
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- 1992
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Direct Imaging of Ordering in Si-Ge Alloys, Ultrathin Superlattices, and Buried Ge Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 220 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 141
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- 1991
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Incoherent Imaging of Materials Structure and Composition by Z-Contrast Stem
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- Journal:
- MRS Online Proceedings Library Archive / Volume 183 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 211
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- 1990
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“Column-By-Column” Compositional Mapping At Semiconductor Interfaces Using Z-Contrast Stem
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- Journal:
- MRS Online Proceedings Library Archive / Volume 183 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 223
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- 1990
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Simulation and Quantification of High-Resolution Z-Contrast Imaging of Semiconductor Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 159 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 439
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- 1989
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Direct Imaging of the Atomic Structure and Chemistry of Defects and Interfaces by Z-Contrast Stem
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- Journal:
- MRS Online Proceedings Library Archive / Volume 169 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 765
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- 1989
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Atomic Structure and Chemistry of Si/Ge Interfaces Determined by Z-Contrast Stem
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- Journal:
- MRS Online Proceedings Library Archive / Volume 159 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 447
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- 1989
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