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Incoherent Imaging of Materials Structure and Composition by Z-Contrast Stem

Published online by Cambridge University Press:  21 February 2011

S. J. Pennycook ,
D. E. Jesson  and
M. F. Chisholm
S. J. Pennycook
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6024
D. E. Jesson
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6024
M. F. Chisholm
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6024
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Abstract

It is shown how the use of a high angle annular detector in a STEM provides images which show strong compositional sensitivity and almost perfect incoherent characteristics. No contrast reversals occur with defocus or sample thickness and the contribution of an atomic string is insensitive to the distribution and strength of neighboring strings. The image is best described in real space as a simple convolution of the incident probe intensity profile with an object function sharply peaked at the atomic strings having a strength dependent on composition. How the incoherent characteristics arise is described using a Bloch wave approach and examples are shown of interfaces in semiconductor and superconductor materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 183: Symposium E – High Resolution Electron Microscopy of Defects in Materials , 1990 , 211
Copyright
Copyright © Materials Research Society 1990

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References

1. Crewe, A. V., Langmore, J. P., and Isaacson, M. S., p. 47 in Physical Aspects of Electron Microscopy and Microbeam Analysis, ed. by Siegel, B. M. and Beaman, D. R. (Wiley and Sons, New York, 1975).Google Scholar
2. Engel, A., Wiggins, J. W., and Woodruff, D. C., J. Appl. Phys. 45, 2739 (1974).10.1063/1.1663659Google Scholar
3. Cowley, J. M., Ultramicroscopy 2, 3 (1976).10.1016/S0304-3991(76)90161-3Google Scholar
4. Donald, A. and Craven, A. S., Phil. Mag. A 39, 1 (1980).10.1080/01418617908239271Google Scholar
5. Howie, A., J. Microsc. 117, 11 (1979).Google Scholar
6. Cherns, D., Howie, A., and Jacobs, M. H., Z. Naturforsch. 28a, 565 (1973).Google Scholar
7. Treacy, M. M. S. and Rice, S. B., J. Microscopy 156, 211 (1989).Google Scholar
8. Pennycook, S. J., Berger, S. D., and Culbertson, R.. J., J. Microscopy 144, 229 (1986).Google Scholar
9. Young, A. P. and Rez, P., J. Phys. C 8, L1 (1975).Google Scholar
10. Gibson, J. M. and Howie, A., Chemica Scripta 14, 109 (1978).Google Scholar
11. Bird, D. M. and Wright, A. G., Acta Cryst A 45, 104 (1989).10.1107/S0108767388009304Google Scholar
12. Pennycook, S. J. and Jesson, D. E., Phys. Rev. Lett. 64, 938 (1990).10.1103/PhysRevLett.64.938Google Scholar
13. Kambe, K., Lehmpfuhl, G., and Fujimoto, F., Z. Naturforsch. 29a, 1034 (1974).Google Scholar
14. Jesson, D. E., Pennycook, S. J., and Baribeau, J.-M., these proceedings.Google Scholar
15. Treacy, M. M. J., J. Microsc. Spectrosc. Electron 7, 511 (1982).Google Scholar
16. Spence, J. C. H., Zuo, J. M., and Lynch, J., Ultramicroscopy 31, 233 (1989).Google Scholar
17. Jesson, D. E., Pennycook, S. J., and Chisholm, M. F., in Atomic Scale Structure of Interfaces, ed. by Bringans, R. D., Feenstra, R. M., and Gibson, J. M., Materials Research Society Symposia Series No. 159, Materials Research Society, Pittsburgh, Pennsylvania (in press); see also Proc. XIlth Int. Congr. for Electron Microscopy, San Francisco Press, San Francisco, California (in press).Google Scholar
18. Loane, R. F., Kirkland, E. J., and Silcox, J., Acta Cryst. A 44, 912 (1988).10.1107/S0108767388006403Google Scholar
19. Shin, D. H., Kirkland, E. J., and Silcox, J., Appl. Phys. Lert. 55, 2456 (1989).Google Scholar
20. Xu, P., Kirkland, E. J., Silcox, J., and Keyse, R., Ultramicroscopy, 1990 (in press).Google Scholar
21. Yalisove, S. M., Tung, R. T., and Loretto, D., J. Vac. Sci. Technol. A 7, 1472 (1989).Google Scholar
22. Loretto, D., Gibson, J. M., and Yalisove, S. M., Phys. Rev. Lett. 63, 298 (1989).Google Scholar
23. Pennycook, S. J. et al., in High Temperature Superconductors: Fundamental Properties and Novel Materials Processing, ed. by Christen, D. K., Chu, P., Narayan, J., and Schneemyer, L. F., Materials Research Society Symposia Series No. 169, Materials Research Society, Pittsburgh, Pennsylvania (in press).Google Scholar
24. Triscone, J. M., Karkut, M. G., Antognazza, L., Brunner, O., and Fischer, O., Phys. Rev. Lett. 63, 1016 (1989).Google Scholar
25. Venkatesan, T. et al., Appl. Phys. Lett. 56, 391 (1990).10.1063/1.103291Google Scholar
26. Lowndes, D. H. et al., in Laser Ablation for Materials Synthesis, ed. by Bravman, J. C. and Paine, D. C., Materials Research Society Symposia Series, Materials Research Society, Pittsburgh, Pennsylvania (in press).Google Scholar
27. Fathy, D., Holland, O. W., and White, C. W., Appl. Phys. Lett. 51, 1337 (1987).Google Scholar
28. Chisholm, M. F., Pennycook, S. J., and Jesson, D. E., in Atomic Scale Structure of Interfaces, ed. by Bringans, R. D., Feenstra, R. M., and Gibson, J. M., Materials Research Society Symposia Series No. 159, Materials Research Society, Pittsburgh, Pennsylvania (in press).Google Scholar
29. Treacy, M. M. J., Gibson, J. M. and Howie, A., Phil. Mag. A 51, 389 (1985).10.1080/01418618508237563Google Scholar
30. Hafich, M. J., Quigley, J. H., Owens, R. E., Robinson, G. Y., Li, Du, and Otsuka, N., Appl. Phys. Lett. 54, 2686 (1989).10.1063/1.101035Google Scholar
31. Bourret, A., p. 293 in Characterizationo f the Structure and Chemistry of Defects in Materials, ed. by Larson, B. C., Rühle, M., and Seidman, D. N., Materials Research Society Symposia Series No. 139, Materials Research Society, Pittsburgh, Pennsylvania, 1989.Google Scholar
32. Hull, R., Gibson, J. M., and Bean, J. C., Appl. Phys. Lett. 46, 179 (1985).Google Scholar
33. Ourmazd, A., Taylor, D. W., Cunningham, J., and Tu, C. W., Phys. Rev. Lett. 62, 933 (1989).Google Scholar
34. Zandbergen, H. W., Gronsky, R., Wang, K., and Thomas, G., Nature 331, 596 (1988).Google Scholar