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Analysis of depth profiles of sol-gel derived multilayer coatings by Rutherford backscattering spectrometry and by cross-sectional transmission electron microscopy1
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- Journal:
- Journal of Materials Research / Volume 6 / Issue 4 / April 1991
- Published online by Cambridge University Press:
- 31 January 2011, pp. 835-839
- Print publication:
- April 1991
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- Article
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