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Scanning microwave microscopy of buried CMOS interconnect lines with nanometer resolution
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- Journal:
- International Journal of Microwave and Wireless Technologies / Volume 10 / Issue 5-6 / June 2018
- Published online by Cambridge University Press:
- 17 April 2018, pp. 556-561
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Contributors
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- The Burdens of Mental Disorders
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- 09 May 2013, pp ix-xii
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Evaluating and predicting lifetime in capacitive MEMS switches
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- Journal:
- International Journal of Microwave and Wireless Technologies / Volume 3 / Issue 5 / October 2011
- Published online by Cambridge University Press:
- 21 September 2011, pp. 565-570
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The Effect of Glass Chemistry on the Microstructub and Properties of Self Reinforced Silicon Nitride
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- MRS Online Proceedings Library Archive / Volume 287 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 411
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- 1992
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