7 results
EFTEM Contrast Tuning and EELS Fine Structure Analysis for Characterization of Carbon Containing Ultra-Low-k Dielectric Materials
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 831-832
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- August 2015
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Energy-dispersive x-ray spectrum simulation and emprical observation of 22nm node high-k metal gate structure
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1785-1786
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- August 2015
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Atomic Layer Deposition and Vapor Deposited SAMS in a CrossBeam FIB-SEM Platform: A Path To Advanced Materials Synthesis
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- Journal:
- Microscopy Today / Volume 17 / Issue 2 / March 2009
- Published online by Cambridge University Press:
- 14 March 2018, pp. 18-25
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- March 2009
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Multiple Analytical Instrumentation for Complete Materials Characterization
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 256-257
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- August 2003
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Avoiding the Curtaining Effect: Backside Milling by FIB INLO
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 28 July 2003, pp. 116-117
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- August 2003
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Automated Crystallography and Grain Mapping in the TEM
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 656-657
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- August 2002
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TEM of Sub-Micrometer Particles using the FIB Lift-Out Technique
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 950-951
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- August 2001
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