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Multiple Analytical Instrumentation for Complete Materials Characterization

Published online by Cambridge University Press:  06 August 2003

Stephen M. Schwarz ,
Brian W. Kempshall ,
Lucille A. Giannuzzi  and
Fred A. Stevie
Stephen M. Schwarz
Affiliation:
Mechanical Materials and Aerospace Eng., University of Central Florida, Orlando, FL 32816-2450
Brian W. Kempshall
Affiliation:
Mechanical Materials and Aerospace Eng., University of Central Florida, Orlando, FL 32816-2450
Lucille A. Giannuzzi
Affiliation:
Mechanical Materials and Aerospace Eng., University of Central Florida, Orlando, FL 32816-2450
Fred A. Stevie
Affiliation:
North Carolina State University, Analytical Instrumentation Facility, Raleigh, NC 27695-7531

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 256 - 257
Copyright
Copyright © Microscopy Society of America 2003