16 results
Cryogenic Electron Microscopy Combined with Energy-Dispersive X-ray Spectroscopy Tomography for Materials Science
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 328-330
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- August 2022
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Robotic Fabrication of High-quality Lamellae for Aberration-corrected Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 54-56
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- August 2022
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Low Energy 500 eV Focused Argon Ion Beam Provided by Multi-Ions Species Plasma FIB for Material Science Sample Preparations
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 20-22
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- August 2021
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Improvements in Low Voltage PFIB for Sample Preparation and Large Volume Serial Sectioning Tomography
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 898-899
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- August 2020
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O+ PFIB Milling and Measurement of FIB Damage in Silicon
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 414-415
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- August 2020
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SIMS Detector on FIB/SEM DualBeam Microscopes for Material Science Applications
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 408-409
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- August 2020
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Using a Plasma FIB Equipped with Xe, N2, O2 and Ar for Atom Probe Sample Preparation – Ion Implantation and Success Rates
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 316-317
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- August 2019
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Ar+ FIB Milling and Measurement of FIB Damage in Silicon
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 886-887
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- August 2019
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Latest Developments in Multiple Ion Species Plasma FIB Technology
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 570-571
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- August 2019
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Investigation of slice thickness for FIB tomography in a plasma focused ion beam system
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 858-859
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- August 2018
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New Workflows Broaden Access to S/TEM Analysis and Increase Productivity
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- Microscopy Today / Volume 26 / Issue 1 / January 2018
- Published online by Cambridge University Press:
- 05 January 2018, pp. 18-25
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- January 2018
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Improvements in Characterization of FIB Prepared Surfaces of Aluminum Using Xe+ Plasma FIB
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 272-273
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- July 2017
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Ga+ and Xe+ FIB Milling and Measurement of FIB Damage in Aluminum
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 296-297
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- July 2017
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Xe+ FIB Milling and Measurement of Amorphous Damage in Diamond
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 178-179
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- July 2016
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Ga+ FIB Milling and Measurement of FIB Damage in Sapphire
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 346-347
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- August 2014
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Thickness Variations and Absence of Lateral Compositional Fluctuations in Aberration-Corrected STEM Images of InGaN LED Active Regions at Low Dose
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- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
- Published online by Cambridge University Press:
- 26 March 2014, pp. 864-868
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- June 2014
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