6 results
The Correlation between Ion Beam/Material Interactions and Practical FIB Specimen Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue 3 / June 2003
- Published online by Cambridge University Press:
- 23 May 2003, pp. 216-236
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- June 2003
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Characterization of Si in a W matrix Using Diffraction Contrast in the TEM
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 790-791
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- August 2002
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In-Situ Transformation of a Zinc Tem Lift-Out Specimen
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 928-929
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- August 1999
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Characterization of FIB Damage in Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 740-741
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- August 1999
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TEM FIB Lift-Out of Mount Saint Helens Volcanic Ash
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 908-909
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- August 1999
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Material Dependence of Sputtering Behavior During Focused Ion Beam Milling: A Correlation Between Monte Carlo Based Simulation and Empirical Observation
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 858-859
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- July 1998
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