5 results
Energy Dispersive Spectrometry Calibration For The HD -2000 STEM
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1192-1193
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- August 2002
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Auger Analysis Of Focused Ion Beam Prepared Lift -Out Specimens
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 556-557
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- August 2002
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A Stress Relief Method to Control Warping of Focused Ion Beam Prepared Membranes for Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 532-533
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- August 2000
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Focused Ion Beam Induced Copper Artifact Dose Study
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 534-535
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- August 2000
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Chain Structure Defect Location by Focused Ion Beam Passive Voltage Contrast
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 520-521
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- August 2000
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