2 results
Lateral uniformity of the transport properties of graphene/4H-SiC (0001) interface by nanoscale current measurements
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1205 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1205-L03-02
- Print publication:
- 2009
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- Article
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Stress Metrology : The challenge for the next generation of engineered wafers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 809 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, B3.1
- Print publication:
- 2004
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- Article
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