2 results
Tem Structure Characterization Of Ti/Al and Ti/Al/Ni/Au Ohmic Contacts For n-GaN
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 201
- Print publication:
- 1996
-
- Article
- Export citation
Microstructures of AlN Buffer Layers for the Growth of GaN on (0001) Al2O3
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 449 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 239
- Print publication:
- 1996
-
- Article
- Export citation