16 results
Atom Probe Analysis of a Zr-based Bulk Metallic Glass
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 4 / August 2022
- Published online by Cambridge University Press:
- 01 October 2021, pp. 1348-1358
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- August 2022
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Community-Driven Methods for Open and Reproducible Software Tools for Analyzing Datasets from Atom Probe Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue 4 / August 2022
- Published online by Cambridge University Press:
- 27 July 2021, pp. 1038-1053
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- August 2022
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Integrative Atom Probe Tomography Using Scanning Transmission Electron Microscopy-Centric Atom Placement as a Step Toward Atomic-Scale Tomography
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- Microscopy and Microanalysis / Volume 27 / Issue 1 / February 2021
- Published online by Cambridge University Press:
- 20 January 2021, pp. 140-148
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- February 2021
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Interpreting the Simplified Multicomponent Short-Range Order Parameter
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 332-333
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- August 2019
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Improving Spatial Accuracy in Atom Probe Tomography through a Crystallography-Mediated Reconstruction (CMR)
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 292-293
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- August 2019
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Assessing the Spatial Accuracy of the Reconstruction in Atom Probe Tomography and a New Calibratable Adaptive Reconstruction
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- Microscopy and Microanalysis / Volume 25 / Issue 2 / April 2019
- Published online by Cambridge University Press:
- 25 April 2019, pp. 309-319
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- April 2019
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Introducing a Crystallography-Mediated Reconstruction (CMR) Approach to Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 25 / Issue 2 / April 2019
- Published online by Cambridge University Press:
- 04 February 2019, pp. 288-300
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- April 2019
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Atom probe tomography of phosphorus- and boron-doped silicon nanocrystals with various compositions of silicon rich oxide — ERRATUM
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- MRS Communications / Volume 6 / Issue 4 / December 2016
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- 17 October 2016, p. 469
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- December 2016
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Atom probe tomography of phosphorus- and boron-doped silicon nanocrystals with various compositions of silicon rich oxide
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- MRS Communications / Volume 6 / Issue 3 / September 2016
- Published online by Cambridge University Press:
- 14 September 2016, pp. 283-288
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- September 2016
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The Use of Online Tools in Microscopy and Microanalysis Core Facilities
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 527-528
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- August 2015
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Simulation-Enhanced Atom Probe for Complete 3D Atomistic Imaging
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 998-999
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- August 2013
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The Development and Use of Online Tools in Microscopy and Microanalysis Facilities
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 616-617
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- August 2013
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Tracing the Solute Distribution and Effects in Materials by Combining Atom Probe Tomography and Atomistic Simulation: Summary of Recent Results
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 932-933
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- August 2013
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A Lattice-Rectified and Detection Efficiency Compensated APT Reconstruction
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 722-723
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- July 2011
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Lattice Rectification in Atom Probe Tomography: Toward True Three-Dimensional Atomic Microscopy
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- Microscopy and Microanalysis / Volume 17 / Issue 2 / April 2011
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- 08 March 2011, pp. 226-239
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- April 2011
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Analysis Techniques For Nanoscale Solute Clustering In Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1602-1603
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- August 2007
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