Powder Diffraction: Volume 25 -

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 25 - June 2010

Contents

Page 8 of 11

Denver X-Ray Conference

D-58 Invited—Applications of Time-Resolved Synchrotron X-ray Diffraction to Mineral-Fluid Reactions
P. J. Heaney, T. B. Fischer, C. R. Fleeger, D. R. Hummer, K. M. Peterson, A. J. Wall, J. E. Post
Published online by Cambridge University Press:

20 May 2016, p. 213
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D-14 Synthesis and Characterization of Ettringites
H. Poellmann
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20 May 2016, p. 214
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D-33 Oxygen Octahedral Environments in Three-Layer Aurivillius Phases via Combined X-ray and Neutron Powder Diffraction
E. J. Nichols, S. T. Misture
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20 May 2016, p. 214
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D-95 Bond Length Evolution in 312 and 211 Max Phases from High Temperature Neutron Diffraction and Rietveld Analysis
N. J. Lane, M. W. Barsoum, S. C. Vogel
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20 May 2016, p. 214
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D-12 Quantifying the Extent to which Experimental Pole Intensity Data Determine an Orientation Density Function Explaining the Data
R. Hielscher, H. Schaeben
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20 May 2016, p. 214
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Invited—Title to be announced
J. Gearheart
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20 May 2016, p. 214
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F-32 Invited—Assessing the Environment with X-ray Fluorescence
J. Boman, J. B. C. Pettersson, M. Gatari, A. Wagner, P. Molnár
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20 May 2016, p. 214
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F-47 Invited—X-ray Fluorescence Spectrometry in the Environmental Field: A Review of Some Recent Investigations and Applications
E. Margui, I. Queralt, M. Hidalgo, R. Van Grieken
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20 May 2016, p. 214
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F-7 Characterization of Silicon Drift Detectors for EDXRF
R. Redus, T. Pantazis, J. Pantazis, A. Huber
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20 May 2016, p. 214
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F-39 Invited— Micro-XRF Analysis of Metal Alloys: From the Laboratory Calibration Towards In-Situ Analyses
A. G. Karydas, V. Kantarelou, D. Sokaras, D. Wegrzynek, E. Chinea-Cano, A. Markowicz, P. Wobrauschek, C. Streli, K. Uhlir, M. Griesser
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20 May 2016, p. 214
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F-55 Indoor Air Quality in Brazilian Schools Nearby Industries: The Case of Curitiba
R. H. M. Godoi, A. F. L. Godoi, M. G. Arantes, S. J. Gonçalves, Jr, L. C. Stroppa, R. Alves, J. E. Ferreira da Costa Gardolinski, J. Manoel dos Reis Neto, E. M. Fortunato de Lucena Reynaldo, B. Alfody, Y. Makarovska, R. Van Grieken
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20 May 2016, p. 215
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F-60 XRS for Preventive Conservation of Cultural Heritage
R. Van Grieken
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20 May 2016, p. 215
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F-18 Invited—Analytical Strategy for Compositional and Layer Thickness Analysis of Copper-Indium-Gallium-Selenium on Molybdenum Coated Glass Substrates
L. L. Brehm, T. T. Hasan, D. A. Libby, T. R. Bryden
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20 May 2016, p. 215
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C-4 XANES Based Quantitative Phase Analysis in Cu2ZnSnS4
H. D. Rosenfeld
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20 May 2016, p. 215
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F-4 Quantification of Two-Polymeric Phases in Paint Formulation by X-ray Fluorescence and X-ray Photoelectron Spectroscopy
P. Ricou, R. Gupta
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20 May 2016, p. 215
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F-11 Glancing Versus Normal XRF Excitation with Monochromatic and Polychromatic Radiation for the Composition Analysis of SmCo Based Films on Silicon Wafers
F. J. Cadieu, I. Vander, R. W. Zuneska
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20 May 2016, p. 215
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F-61 Depth-Resolved Speciation of Buried Nanolayers
B. Pollakowski, B. Beckhoff
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20 May 2016, p. 215
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F-66 Investigation of Spin-Coated Inorganic Contamination on Si Surfaces by Various Analytical Techniques
B. Beckhoff, M. Kolbe, M. Müller, A. Nutsch, R. Altmann, G. Borionetti, C. Pello, M. L. Polignano, D. Codegoni, S. Grasso, E. Cazzini, M. Bersani, P. Lazzeri, S. Gennaro, P. Kregsamer, F. Posch
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20 May 2016, p. 215
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F-41 X-ray Fluorescence Analysis of Palladium in Non-Homogeneous Organics and Slurries via Gel Suspensions
D. W. Burns, Y. Yang, S. Yusuf, D. G. Coler
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20 May 2016, p. 215
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F-13 Advantages and Disadvantages of Bayesian Methods for Obtaining XRF Net Intensities
W. T. Elam, B. Scruggs, F. Eggert, J. Nicolosi
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20 May 2016, p. 215
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Page 8 of 11

Powder Diffraction

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Volume 25 - June 2010

Denver X-Ray Conference

D-58 Invited—Applications of Time-Resolved Synchrotron X-ray Diffraction to Mineral-Fluid Reactions

D-14 Synthesis and Characterization of Ettringites

D-33 Oxygen Octahedral Environments in Three-Layer Aurivillius Phases via Combined X-ray and Neutron Powder Diffraction

D-95 Bond Length Evolution in 312 and 211 Max Phases from High Temperature Neutron Diffraction and Rietveld Analysis

D-12 Quantifying the Extent to which Experimental Pole Intensity Data Determine an Orientation Density Function Explaining the Data

Invited—Title to be announced

F-32 Invited—Assessing the Environment with X-ray Fluorescence

F-47 Invited—X-ray Fluorescence Spectrometry in the Environmental Field: A Review of Some Recent Investigations and Applications

F-7 Characterization of Silicon Drift Detectors for EDXRF

F-39 Invited— Micro-XRF Analysis of Metal Alloys: From the Laboratory Calibration Towards In-Situ Analyses

F-55 Indoor Air Quality in Brazilian Schools Nearby Industries: The Case of Curitiba

F-60 XRS for Preventive Conservation of Cultural Heritage

F-18 Invited—Analytical Strategy for Compositional and Layer Thickness Analysis of Copper-Indium-Gallium-Selenium on Molybdenum Coated Glass Substrates

C-4 XANES Based Quantitative Phase Analysis in Cu2ZnSnS4

F-4 Quantification of Two-Polymeric Phases in Paint Formulation by X-ray Fluorescence and X-ray Photoelectron Spectroscopy

F-11 Glancing Versus Normal XRF Excitation with Monochromatic and Polychromatic Radiation for the Composition Analysis of SmCo Based Films on Silicon Wafers

F-61 Depth-Resolved Speciation of Buried Nanolayers

F-66 Investigation of Spin-Coated Inorganic Contamination on Si Surfaces by Various Analytical Techniques

F-41 X-ray Fluorescence Analysis of Palladium in Non-Homogeneous Organics and Slurries via Gel Suspensions

F-13 Advantages and Disadvantages of Bayesian Methods for Obtaining XRF Net Intensities

Powder Diffraction

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Volume 25 - June 2010

Denver X-Ray Conference