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The Use of Fourier Self-Deconvolution to Resolve Overlapping X-Ray Powder Diffraction Peaks

Published online by Cambridge University Press:  10 January 2013

Ernest E. Armstrong  and
David G. Cameron
Ernest E. Armstrong
Affiliation:
BP America Research and Development, 4440 Warrensville Center Road, Cleveland, Ohio 44128, U.S.A.
David G. Cameron
Affiliation:
BP America Research and Development, 4440 Warrensville Center Road, Cleveland, Ohio 44128, U.S.A.
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Abstract

Fourier self-deconvolution has been successfully applied as a means of obtaining semi-quantitative information by resolving the overlapping peaks in X-ray powder diffractograms collected from mixtures of kaolinite and ripidolite. A series of diffractograms were collected from known mixtures of the two minerals. The diffractograms were then processed using Fourier self-deconvolution over a selected range between 23 and 27° 2θ (encompassing the overlapping peaks of kaolinite (002) and ripidolite (004) at 24.85 and 25.13° 2θ, respectively). Once deconvoluted, areas under individual peaks of kaolinite and ripidolite were calculated using curve fitting. The calculated percentage of kaolinite in the mixtures was then plotted versus the true weight percent of kaolinite. The same procedure was conducted on the original diffractograms using only curve fitting without first deconvoluting. A comparison of results shows that, provided the number of peaks are known, both methods give nearly equal results. However, Fourier self-deconvolution, by increasing the resolution, greatly improves the ability to detect overlapping peaks.

Type
Research Article
Information
Powder Diffraction , Volume 4 , Issue 3 , September 1989 , pp. 144 - 151
Copyright
Copyright © Cambridge University Press 1989

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