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Refinement of the structure of ScPO4 by powder diffraction by three Rietveld programs

Published online by Cambridge University Press:  10 January 2013

Svend Erik Rasmussen ,
Jens-Erik Jørgensen  and
Britta Lundtoft
Svend Erik Rasmussen
Affiliation:
Department of Inorganic Chemistry, University of Aarhus, DK-8000 Aarhus C, Denmark
Jens-Erik Jørgensen
Affiliation:
Department of Inorganic Chemistry, University of Aarhus, DK-8000 Aarhus C, Denmark
Britta Lundtoft
Affiliation:
Department of Inorganic Chemistry, University of Aarhus, DK-8000 Aarhus C, Denmark
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Abstract

Crystal data and results of structure refinements for ScPO4 are reported. The material is tetragonal, I41/amd, with a = 6.5787(2) Å, c = 5.7963(2) Å, Vd = 250.86(2) Å3, Z = 4, Dx = 3.704 Mg/m3. Intensity data were obtained from a Stoe transmission type diffractometer equipped with a position sensitive detector. CuKα1 radiation, λ = 1.5405981 Å was employed. Silicon, SRM 640b (a = 5.43094 Å) was used as an internal standard. The structure was refined by the Rietveld method by aid of three different programs.

Type
Research Article
Information
Powder Diffraction , Volume 8 , Issue 3 , September 1993 , pp. 164 - 167
Copyright
Copyright © Cambridge University Press 1993

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References

Guinier, A. (1963). X-Ray Diffraction (Freeman, San Francisco), p. 104.Google Scholar
Larson, A. C., and Von Dreele, R. B. (1987). Rep. No. LA-UR-86-748, Los Alamos Laboratory, Los Alamos, NM U.S.A.Google Scholar
Mooney, R. C. L. (1956). Acta Crystallogr. 9, 677–678.Google Scholar
Rietveld, H. M. (1969). J. Appl. Crystallogr. 12, 60–65.Google Scholar
Sakthivel, A., and Young, R. A. (1991). Users Guide to Programs DBWS-9006 and DBWS-9006 PC, School of Physics, Georgia Institute of Technology, Atlanta, GA 30332, U.S.A.Google Scholar