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Quantitative X-Ray Powder Diffraction Method Using the Full Diffraction Pattern

Published online by Cambridge University Press:  10 January 2013

Deane K. Smith ,
Gerald G. Johnson Jr ,
Alexandre Scheible ,
Andrew M. Wims ,
Jack L. Johnson  and
Gregory Ullmann
Deane K. Smith
Affiliation:
Materials Research Laboratories, The Pennsylvania State University, University Park, PA 16802, U.S.A.
Gerald G. Johnson Jr
Affiliation:
Materials Research Laboratories, The Pennsylvania State University, University Park, PA 16802, U.S.A.
Alexandre Scheible
Affiliation:
Materials Research Laboratories, The Pennsylvania State University, University Park, PA 16802, U.S.A.
Andrew M. Wims
Affiliation:
Analytical Chemistry Department, General Motors Research Laboratories, Warren, MI 48090-9055, U.S.A.
Jack L. Johnson
Affiliation:
Analytical Chemistry Department, General Motors Research Laboratories, Warren, MI 48090-9055, U.S.A.
Gregory Ullmann
Affiliation:
Analytical Chemistry Department, General Motors Research Laboratories, Warren, MI 48090-9055, U.S.A.
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Abstract

A new quantitative X-ray powder diffraction (QXRPD) method has been developed to analyze polyphase crystalline mixtures. The unique approach employed in this method is the utilization of the full diffraction pattern of a mixture and its reconstruction as a weighted sum of diffraction patterns of the component phases. To facilitate the use of the new method, menu-driven interactive computer programs with graphics have been developed for the VAX series of computers. The analyst builds a reference database of component diffraction patterns, corrects the patterns for background effects, and determines the appropriate reference intensity ratios. This database is used to calculate the weight fraction of each phase in a mixture by fitting its diffraction pattern with a least-squares best-fit weighted sum of selected database reference patterns.

The new QXRPD method was evaluated using oxides found in ceramics, corrosion products, and other materials encountered in the laboratory. Experimental procedures have been developed for sample preparation and data collection for reference samples and unknowns. Prepared mixtures have been used to demonstrate the very good results that can be obtained with this method.

Type
Research Article
Information
Powder Diffraction , Volume 2 , Issue 2 , June 1987 , pp. 73 - 77
Copyright
Copyright © Cambridge University Press 1987

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References

Alexander, L. E. & Klug, H. P. (1948). Anal. Chem. 30, 196.Google Scholar
Chung, F. H. (1975). J. Appl. Crystallogr. 8, 17.CrossRefGoogle Scholar
Copeland, L. E. & Bragg, R. H. (1958). Anal. Chem. 30, 196.CrossRefGoogle Scholar
Davis, B. L. (1986). Reference Intensity Method of Quantitative X-ray Diffraction Analysis, South Dakota School of Mines and Technology.Google Scholar
Garbauskas, M. F., & Goehner, R. P. (1982). Adv. X-Ray Anal. 25, 283.Google Scholar
Goehner, R. P. (1982). Adv. X-Ray Anal. 25, 309.Google Scholar
Haskell, K. H. & Hanson, R. J. (1979). Report SAND78-1290, Sandia Laboratories, New Mexico.Google Scholar
Haskell, K. H. & Hanson, R. J. (1978). Report SAND77-0052, Sandia Laboratories, New Mexico.Google Scholar
Hubbard, C. R., Robbins, C. R., & Snyder, R. L. (1982). Adv. X-Ray Anal. 26, 149.Google Scholar
Johnson, L. T., Chu, C. H., & Hussey, G. A. (1985). Clays Clay Miner. 33, No. 2, 107.CrossRefGoogle Scholar
Kamarchik, P. & Ratliff, J. (1983). Adv. in X-Ray Anal. 26, 129.Google Scholar
Klug, H. P. (1953). Anal. Chem. 25, 704.CrossRefGoogle Scholar
Popovič, S. & Gržeta-Phenhovic, . (1979). J. Appl. Crystallogr. 12, 205.CrossRefGoogle Scholar
Slaughter, M., (1986). To be published by the Clay Mineral Society.Google Scholar
Smith, D. K., Nichols, M. C., & Holomany, M. A. (1981). Report SAND81-8226, Sandia Laboratories, New Mexico.Google Scholar
Wong, E. R., Yeko, J., Engler, P., & Gerron, R. A. (1982). Adv. X-Ray Anal. 26, 157.Google Scholar
Zevin, L. S. (1977). J. Appl. Crystallogr. 10, 147.CrossRefGoogle Scholar