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Quantification of stacking disordered Si–Al layer silicates by the Rietveld method: application to exploration for high-sulphidation epithermal gold deposits

Published online by Cambridge University Press:  22 April 2015

Kristian Ufer ,
Reinhard Kleeberg  and
Thomas Monecke
Kristian Ufer*
Affiliation:
Federal Institute for Geosciences and Natural Resources, Geozentrum Hannover, Stilleweg 2, 30655 Hannover, Germany
Reinhard Kleeberg
Affiliation:
Institute of Mineralogy, Brennhausgasse 14, TU Bergakademie Freiberg, 09599 Freiberg, Germany
Thomas Monecke
Affiliation:
Department of Geology and Geological Engineering, Colorado School of Mines, 1516 Illinois Street, Golden 80401, Colorado
*
a)Author to whom correspondence should be addressed. Electronic mail: Kristian.Ufer@bgr.de
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Abstract

Hydrothermally altered rocks hosting precious metal deposits frequently contain stacking disordered layer silicates. X-ray diffraction analysis using the Rietveld method can be used to determine mineral abundances in these rocks if suitable disorder models are applied. It is shown here that disorder models of kaolinite and pyrophyllite can be described by a recursive calculation of structure factors. This permits the physically sound refinement of real structure parameters of these disordered minerals and the determination of mineral abundances. Even mixtures containing two disordered Si–Al layer silicates can be quantified reliably. The developed disorder models can now be implemented in routine phase analysis, allowing the quantification of large numbers of samples to identify mineralogical gradients surrounding ore deposits.

Keywords

Rietveld methodBGMNkaolinitepyrophyllitestacking disorderSi–Al layer silicates
Type
Technical Articles
Information
Powder Diffraction , Volume 30 , Supplement S1 , June 2015 , pp. S111 - S118
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Copyright
Copyright © International Centre for Diffraction Data 2015 

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