Hostname: page-component-77c89778f8-5wvtr Total loading time: 0 Render date: 2024-07-19T18:48:32.063Z Has data issue: false hasContentIssue false

Materials characterization using a novel simultaneous near-infrared/X-ray diffraction instrument

Published online by Cambridge University Press:  06 March 2012

Tom Blanton*
Affiliation:
Eastman Kodak Company, Imaging Materials Research and Development, Rochester, New York 14650-2106
Craig Barnes
Affiliation:
Eastman Kodak Company, Imaging Materials Research and Development, Rochester, New York 14650-2106
Julie Putrelo
Affiliation:
Eastman Kodak Company, Imaging Materials Research and Development, Rochester, New York 14650-2106
Agyare Yeboah
Affiliation:
Eastman Kodak Company, Imaging Materials Research and Development, Rochester, New York 14650-2106
Steve Switalski
Affiliation:
Eastman Kodak Company, Imaging Materials Research and Development, Rochester, New York 14650-2106
*
a)Electronic mail: thomas.blanton@kodak.com

Abstract

X-ray powder diffraction (XRD) is utilized for the determination of polymorphism in crystalline organic materials. Though convenient to use in a laboratory setting, XRD is not easily adapted to in situ monitoring of synthetic chemical production applications or thin film depositions. Near-infrared spectroscopy (NIR) can be adapted to in situ manufacturing schemes by use of a source/detector probe. Conversely, NIR is unable to conclusively define the existence of polymorphism in crystalline materials. By combining the two techniques, a novel simultaneous NIR/XRD instrument has been developed. During material’s analysis, results from XRD allowed for the determination of the existence of polymorphic phases, and NIR data were collected as a fingerprint for each of the observed polymorphs. These NIR fingerprints allowed for the development of a library, which can be referenced during the use of a NIR probe in manufacturing settings. The NIR/XRD instrument was also used to monitor materials during exposure to ambient air. XRD can detect crystalline phase changes and NIR can monitor solvent loss and/or water uptake.

Type
Technical Articles
Copyright
Copyright © Cambridge University Press 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bernstein, J. and Henck, J. (2000). Industrial Applications of X-ray Diffraction, edited by F. H. Chung and D. K. Smith (Marcel Dekker, New York), pp. 527–538.Google Scholar
Buhrke, V. E., Jenkins, R., and Smith, D. K. (1998). In Preparation of Specimens for X-ray Fluorescence and X-ray Diffraction Analysis (Wiley-VCH, New York), pp. 145–148.Google Scholar
Threlfall, T. L. (1995). Analyst (Amsterdam) ANLYAG 120, 24352460. anm, ANLYAG Google Scholar