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JCPDS—International Centre for Diffraction Data round robin study of silver behenate. A possible low-angle X-ray diffraction calibration standard

Published online by Cambridge University Press:  10 January 2013

T. N. Blanton ,
T. C. Huang ,
H. Toraya ,
C. R. Hubbard ,
S. B. Robie ,
D. Louër ,
H. E. Göbel ,
G. Will ,
R. Gilles  and
T. Raftery
T. N. Blanton*
Affiliation:
Eastman Kodak Company, USA
T. C. Huang
Affiliation:
International Business Machine Company, USA
H. Toraya
Affiliation:
Nagoya Institute of Technology, Japan
C. R. Hubbard
Affiliation:
Oak Ridge National Laboratories, USA
S. B. Robie
Affiliation:
Scintag Incorporated, USA
D. Louër
Affiliation:
Université de Rennes, France
H. E. Göbel
Affiliation:
Siemens AG, Germany
G. Will
Affiliation:
University of Bonn, Germany
R. Gilles
Affiliation:
University of Bonn, Germany
T. Raftery
Affiliation:
Queensland University of Technology, Australia
*
a) Author to whom correspondence should be addressed: Eastman Kodak Company, Kodak Park B49, Rochester, NY 14652-3712.
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Abstract

A task group of the JCPDS—International Center for Diffraction Data (ICDD) was established with the charge of investigating the use of silver behenate, CH3(CH2)20COO·Ag, as a possible low-angle calibration standard for powder diffraction applications. Utilizing several data collection and analysis techniques, long-period spacing (d001) values with a range of 58.219–58.480 Å were obtained. Using the same collected data and one data analysis refinement calculation method resulted in dm values with a range of 58.303–58.425 Å. Data collected using a silicon internal standard and the same singular data analysis calculation method provided d001 values with a range of 58.363–58.381 Å.

Keywords

silver behenateX-ray diffractionlow-angle calibration
Type
Research Article
Information
Powder Diffraction , Volume 10 , Issue 2 , June 1995 , pp. 91 - 95
Copyright
Copyright © Cambridge University Press 1995

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References

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