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F-7 Development of a Novel Multi-Element Silicon Drift Detector Array

Published online by Cambridge University Press:  20 May 2016

L. Feng ,
V. D. Saveliev ,
C. R. Tull ,
S. Barkan ,
M. Takahashi  and
E. V. Damron
L. Feng
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
V. D. Saveliev
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
C. R. Tull
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
S. Barkan
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
M. Takahashi
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
E. V. Damron
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 173
Copyright
Copyright © Cambridge University Press 2008

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