Hostname: page-component-848d4c4894-wg55d Total loading time: 0 Render date: 2024-05-01T00:57:18.170Z Has data issue: false hasContentIssue false
  • English
  • Français

F-15 Novel Silicon Drift Detectors with Enhanced Reliability for Increasing Requirements of Analytical Applications

Published online by Cambridge University Press:  20 May 2016

O. Boslau ,
T. Eggert ,
J. Kemmer ,
A. Pahlke ,
S. Pahlke ,
R. Stoetter  and
F. Wiest
O. Boslau
Affiliation:
Ketek GmbH, Munich, Germany
T. Eggert
Affiliation:
Ketek GmbH, Munich, Germany
J. Kemmer
Affiliation:
Ketek GmbH, Munich, Germany
A. Pahlke
Affiliation:
Ketek GmbH, Munich, Germany
S. Pahlke
Affiliation:
Ketek GmbH, Munich, Germany
R. Stoetter
Affiliation:
Ketek GmbH, Munich, Germany
F. Wiest
Affiliation:
Ketek GmbH, Munich, Germany
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 22 , Issue 2 , June 2007 , pp. 178
Copyright
Copyright © Cambridge University Press 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)