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Establishing an Instrumental Peak Profile Calibration Standard for Powder Diffraction Analyses: International Round Robin Conducted by the JCPDS-ICDD and the U.S. National Bureau of Standards†

Published online by Cambridge University Press:  10 January 2013

T. G. Fawcett ,
C. E. Crowder ,
S. J. Brownell ,
Y. Zhang ,
C. Hubbard ,
W. Schreiner ,
G. P. Hamill ,
T. C. Huang ,
E. Sabino  and
J. I. Langford
...Show all authors
T. G. Fawcett
Affiliation:
The Dow Chemical Company, France
C. E. Crowder
Affiliation:
The Dow Chemical Company, France
S. J. Brownell
Affiliation:
The Dow Chemical Company, France
Y. Zhang
Affiliation:
University of Maryland, France
C. Hubbard
Affiliation:
The National Bureau of Standards, France
W. Schreiner
Affiliation:
Philips Laboratories, France
G. P. Hamill
Affiliation:
GTE Laboratories Inc., France
T. C. Huang
Affiliation:
IBM Research, France
E. Sabino
Affiliation:
The PQ Corporation, France
J. I. Langford
Affiliation:
University of Birmingham, France
R. Hamilton
Affiliation:
U.K., Air Products Corporation, France
D. Louër
Affiliation:
University of Rennes, France
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Extract

With the explosive growth in the number of highly automated powder diffraction systems, many types of analyses which were previously considered a specialty analysis are now performed on a routine basis. Algorithms have been developed for measuring peak profiles from which crystallite sizes, residual microstrain, and X-ray crystal structure (Rietveld techniques for example) can be determined. However, these techniques require an instrumental peak profile calibration standard to correct the experimental data for instrumental broadening due to the system optics.

Significant problems are encountered when laboratories try to cross-correlate or reproduce published data due to the lack of a common reference material for instrumental calibration. This is particularly distressing in microstrain and crystallite size calculations which can be dramatically affected by a poor choice of standard materials. Microstrain and crystallite size measurement are becoming increasingly important for the characterization of advanced materials and catalysts.

Type
Research Article
Information
Powder Diffraction , Volume 3 , Issue 4 , December 1988 , pp. 209 - 218
Copyright
Copyright © Cambridge University Press 1988

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References

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