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Comparison of Intensities from Fixed and Variable Divergence X-Ray Diffraction Experiments

Published online by Cambridge University Press:  10 January 2013

M.E. Bowden  and
M.J. Ryan
M.E. Bowden
Affiliation:
Chemistry Division, Department of Scientific and Industrial Research, Private Bag, Petone, New Zealand
M.J. Ryan
Affiliation:
Chemistry Division, Department of Scientific and Industrial Research, Private Bag, Petone, New Zealand
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Abstract

Diffracted intensities from an X-ray diffractometer operating with fixed or variable divergence slits were compared, following a reported systematic deviation from the theoretical 1/sinθ intensity ratio between these two slit configurations. The theoretical relationship was found to hold over a wide 2θ range provided the anti-scatter slit did not obstruct the beam at higher diffraction angles as the variable slit increased beam divergence. Such obstruction was found to be a possible explanation for the reported deviation.

Type
Research Article
Information
Powder Diffraction , Volume 6 , Issue 2 , June 1991 , pp. 78 - 81
Copyright
Copyright © Cambridge University Press 1991

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References

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