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A Rietveld-analysis program for X-ray powder spectro-diffractometry

Published online by Cambridge University Press:  10 January 2013

Yanan Xiao
Affiliation:
Department of Applied Chemistry, School of Engineering, The University of Tokyo, Hongo, Bunkyo, Tokyo 113-8656, Japan
Shinjiro Hayakawa
Affiliation:
Department of Applied Chemistry, School of Engineering, The University of Tokyo, Hongo, Bunkyo, Tokyo 113-8656, Japan
Yohichi Gohshi
Affiliation:
Department of Applied Chemistry, School of Engineering, The University of Tokyo, Hongo, Bunkyo, Tokyo 113-8656, Japan
Masaharu Oshima
Affiliation:
Department of Applied Chemistry, School of Engineering, The University of Tokyo, Hongo, Bunkyo, Tokyo 113-8656, Japan
Fujio Izumi
Affiliation:
National Institute for Research in Inorganic Materials, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
Hiroki Okudera
Affiliation:
Ceramics Research Laboratory, Nagoya Institute of Technology, Asahigaoka, Tajimi 507-0071, Japan
Hideo Toraya
Affiliation:
Ceramics Research Laboratory, Nagoya Institute of Technology, Asahigaoka, Tajimi 507-0071, Japan
Kazumasa Ohsumi
Affiliation:
Institute of Materials Structure Science, High Energy Accelerator Research Organization, Oho, Tsukuba 305-0801, Japan

Abstract

In order to exploit X-ray powder spectro-diffractometry, the program RIETAN-97ß for refining crystal structure and lattice parameters by the Rietveld method was modified extensively. The resulting software can be used to refine anomalous scattering factors, fr and fi, for specified crystallographic sites near the X-ray absorption edge of a particular element. The effectiveness of the modified software was tested by using powder diffraction patterns simulated by the original RIETAN-97ß software and a series of measured powder diffraction patterns of Fe3O4 with incident X-ray energies near the absorption edge of iron.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1999

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