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An XRPD Investigation of a Face-Centered Cubic Metallic Plating

Published online by Cambridge University Press:  10 January 2013

Clay Olaf Ruud ,
Robin J. McDowell  and
Daniel J. Snoha
Clay Olaf Ruud
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
Robin J. McDowell
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
Daniel J. Snoha
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
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Abstract

Internal elastic strain (i.e., residual stress) and the diffracted X-ray intensity variation over several orientations of crystallites with respect to the specimen surface were investigated as a means of differentiating two qualities of polycrystalline nickel plating. A unique instrument based upon a position-sensitive scintillation X-ray detector was used to apply all of the techniques commonly applied to X-ray stress analysis in this investigation. It was concluded that residual stress measurements did not provide a clear distinction between the two specimens, but comparison of the relative intensities diffracted from crystallographic planes at certain orientations with the surface did provide a distinction.

Type
Research Article
Information
Powder Diffraction , Volume 1 , Issue 2 , June 1986 , pp. 22 - 27
Copyright
Copyright © Cambridge University Press 1986

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References

1.Ruud, C. O., “Position-Sensitive Detector Improves X-Ray Powder Diffraction,” Ind. Res. and Dev., 84–87, Jan. 1983.Google Scholar
2.Ruud, C. O., DiMascio, P. S., and Snoha, D. J., “A Miniature Instrument for Residual Measurement,” Adv. in X-Ray Anal., Vol. 27, Plenum Press, 1984 (to be published).Google Scholar
3.Ruud, C. O., “Application of a Position-Sensitive Scintillation Detector to Nondestructive X-Ray Diffraction Characterization of Metallic Components,” Nondestructive Methods for Material Property Determination, Vol. 1, Plenum Press, 1984.Google Scholar
4.SAE, “Residual Stress Measurement by X-Ray Diffraction — J784a,” Soc. of Auto. Eng., Warrendale, PA, 1971.Google Scholar
5.Ruud, C. O. and Snoha, D. J., “Displacement Errors in the Application of Portable X-Ray Diffraction Stress Measurement Instrumentation,” J. of Metals, Vol. 36, No. 2, 32–38, 1984.Google Scholar
6.Barrett, C. S. and Masalski, T. B., Structure of Metals, 3rd Ed., McGraw-Hill, 1966.Google Scholar
7.Shiraiwa, T. and Sakamoto, Y., “X-Ray Stress Measurement and Its Application to Steel,” The Sumitomo Search, No. 7, 109–135, May 1972.Google Scholar
8.Prevey, P. S., “A Method of Determining the Elastic Properties of Alloys in Selected Crystallographic Direction for X-Ray Diffraction Residual Stress Measurement,” Adv. in X-Ray Anal., Vol. 20, Plenum Press, 345–354, 1971.Google Scholar
9.Brakman, C. M., “Residual Stresses in Cubic Materials with Orthorhombic or Monoclinic Specimen Symmetry: Influence of Texture on ψ Splitting and Non-Linear Behavior,” J. Appl. Cryst., Vol. 16, 325–340, 1983.Google Scholar
10.McSwain, R. H., Hendricks, R. W., Mathis, M. V., Pardue, E. B. S., “X-Ray Stress Analysis of Nickel-Plated Components Using Different Radiation Wavelengths,” Denver X-Ray Conference, Paper P9, 1985.CrossRefGoogle Scholar