22 August 2024: Due to technical disruption, we are experiencing some delays to publication. We are working to restore services and apologise for the inconvenience. For further updates please visit our website: https://www.cambridge.org/universitypress/about-us/news-and-blogs/cambridge-university-press-publishing-update-following-technical-disruption

Skip to main content Accessibility help

Microscopy and Microanalysis

Journal Home

Only show content I have access to (1258)

Only show open access (21)

Over 3 years (1367)

Biological Applications (25)

Plenary Session (2)

Author Index (1)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 26 - December 2020

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Data Processing Using Python in DigitalMicrograph

Quantitative Image Format for Electron Microscopy

Imaging of Electrons with Tracking and Counting Detectors for (S)TEM Applications

Offline Secondary Electron Counting and Conditional Re-illumination in SEM

A New Energy-filtering EBSD/TKD Direct Detector

Towards Automated Electron Microscopy Image Segmentation for Nanoparticles of Complex Shape by Convolutional Neural Networks

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Atomic Structure of the Polarization Modulations in Perovskite Antiferroelectrics

A STEM-EELS Investigation of La0.7Sr0.3CrO3/La0.7Sr0.3MnO3 Multilayer Thin Films

Quantitative Aberration-Corrected STEM for Studies of Oxide Superlattices and Topological Defects in Layered Ferroelectrics

High-Resolution STEM/STEM-EELS Characterization of Entropy-stabilized Oxides Thin Films

Fe-rich Phase Separation in Doped BaTiO3 as Revealed by STEM-EDS

Low Count Detection for EELS Spectrum by Reducing CCD Read-out Noise

Low-voltage STEM-EELS Quantification for Beam Sensitive Material Characterization

Improving the Energy Resolution of Energy Dispersive Spectrometers(EDS) Using Richardson–Lucy Deconvolution

Measuring the Thickness of 2D Materials Using EDS

Analysis of the Dose-Limited Spatial Resolution in Transmission Electron Microscopy

Is a 30 kV CFE-SEM in STEM-in-SEM Mode Suitable for Characterizing Real Materials?

High Resolution Imaging of Dislocations Using Weak Beam Dark Field STEM

Preparation of TEM Samples from Specific Orientations Using FIB-SEM

Nanoparticle Temperature Measurements for MEMS Heater Calibration

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 26 - December 2020

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX