Advances in Instrumentation Symposia
Advances in Imaging and Spectroscopy in STEM
Abstract
Improving the Spatial Resolution of Atomic-Scale EDS Mapping for Chemical Imaging and Quantification of Metallic Alloy Structures
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- 27 August 2014, pp. 130-131
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Anti-Site Defects in Perovskite YAlO3:Ce Using Aberration-Corrected STEM
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- 27 August 2014, pp. 132-133
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Removal of FEG Fluctuations in STEM Imaging
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- 27 August 2014, pp. 134-135
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Interfacial Atomic Number Contrast in Thick Samples
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- 27 August 2014, pp. 136-137
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Study of the Ultrathin Ferroelectric BaTiO3 Film using Scanning Transmission Electron Microscopy
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- 27 August 2014, pp. 138-139
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Putting a New Spin on Scanning Transmission Electron Microscopy
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- 27 August 2014, pp. 140-141
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Sample Thickness Determination By Scanning Transmission Electron Microscopy At Low Electron Energies
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- 27 August 2014, pp. 142-143
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Analytical ETL/EML Layer Investigation of Blue OLEDs
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- 27 August 2014, pp. 144-145
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Channeling of Aberration-corrected STEM Probes at the “Sub-atomic” Scale
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- 27 August 2014, pp. 146-147
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Quantitative Z-contrast Imaging in Scanning Transmission Electron Microscopy of Zeolite-supported Metal Clusters and Single-metal-atom Complexes With Single-Atom Sensitivity
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- 27 August 2014, pp. 148-149
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Simulation of Decoherence in Fluctuation Electron Microscopy
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- 27 August 2014, pp. 150-151
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Accurate Measurement of Thermal Displacement in Filled Skutterudite by Scanning Transmission Electron Microscopy
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- 27 August 2014, pp. 152-153
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Including Thermal Vibrations and Bonding in HAADF-STEM Image Simulation
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- 27 August 2014, pp. 154-155
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Investigation on Polarization Induced Electro-Optical Property of GaN LED Using TEM-EBIC Combined with Cathodoluminescence
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- 27 August 2014, pp. 156-157
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In-situ Atomic-Resolution Study of La1-xSrxCoO3 Using Z-contrast Imaging and EELS
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- 27 August 2014, pp. 158-159
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Near Edge Fine Structure Analysis of Copper in Cu-Bi2Se3 Topological Insulators
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- 27 August 2014, pp. 160-161
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Direct Observation of the Polarity Control Mechanism in Aluminum Nitride Grown on Sapphire by Aberration Corrected Scanning Transmission Electron Microscopy
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- 27 August 2014, pp. 162-163
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Atomic Structure of Thin MoSe2 Films Grown by Molecular Beam Epitaxy
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- 27 August 2014, pp. 164-165
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Reconciling Theory and Experiment in High-resolution Electron Energy-loss Spectroscopy of Plasmon Modes in Individual Nanostructures
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- 27 August 2014, pp. 166-167
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Direct Observation of Asymmetric Sr Diffusion in Sr-δ-Doped La2CuO4
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- 27 August 2014, pp. 168-169
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