Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Microscopy and Characterization of Ceramics, Polymers and Composites

Abstract

Atomically Resolved Local Structure of Conductive Domain Walls in Ferroelectric BiFeO3.

The Use of Mechanical Testing, Photomicrography, and Electron Microscopy to Characterize an Insulating Fiberglass Composite Post-Electrical Arc Failure.

Void Content in Out-of-Autoclave Manufacturing Processes

Non-destructive, Multi-scale 3D Fractographic Analysis of a Carbon Fiber Composite Hockey Stick after Compressive Failure

TEM Sample Preparation of Ceramic Matrix Composites Using FIB

Defects and Strain Accommodation in Epitaxial La0.7Sr0.3MnO3/La0.7Sr0.3CoO3Heterostructures

Monochromated Low-Dose Aberration-Corrected Transmission Electron Microscopy of Diamondoid Carbon Nanothreads

Surface Crystal Plane Determination and Strong Metal-Support Interactions in CeO2Nanorod-Supported CuOx Catalysts

Understanding Initial Formation Stages of Nanomaterials Using Cryo-TEM

Electrospray Deposition of Nanoparticles on TEM Grids

Self-catalyzed Epitaxial Growth of Core-shell Ni@Graphene Nanoparticles from Ni(OH)2-Graphene Composites

Identifying ESC Failures in Polymers using Fractography

Knit Line Failure of a Glass-Filled Polysulfone Pipe Fitting and Fractographic Comparison to Laboratory-Produced Fractures

Quantification of Thermal Aging in Cable Insulation Using Contact Resonances of a U-shaped Atomic Force Microscope Probe

Microscopic Characterization of Fracture Mechanisms in Polystyrene Grafted Nanoparticle Assemblies: The Role of Film Thickness and Grafting Density

Time-Lapse Observation of the Deformation of Polyethylene Lamellae by AFM

High Resolution Transmission Electron Microscopy Study of Montmorillonite Subjected to Rapid Compression

Characterization of Burnt Clays by X-ray Diffraction Analysis, Chemical Analysis and Environmental Scanning Electron Microscopy

Electron Microscopy Study of Nd doped Misfit Layer Structures in the Pb-Nb-Se System

Direct Observation of ferroelectric domain walls in improper ferroelectric (Ca,Sr)3Ti2O7

Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Microscopy and Characterization of Ceramics, Polymers and Composites

Abstract